Analysis of multiple reflection effects in reflective measurements of electrooptic coefficients of.pdf

Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures Dong Hun Park, Chi H. Lee, and Warren N. Herman Laboratory for Physical Sciences, Department of Electrical Engineering, University of Maryland, College Park 20740, USA leomac@umd.edu, chlee@umd.edu, herman@lps.umd.edu Abstract: We present new closed-form expressions for analysis of Teng- Man measurements of the electro-optic coefficients of poled polymer thin films. These expressions account for multiple reflection effects using a rigorous analysis of the multilayered structure for varying angles of incidence. The analysis based on plane waves is applicable to both transparent and absorptive films and takes into account the properties of the transparent conducting electrode layer. Methods for fitting data are presented and the error introduced by ignoring the transparent conducting layer and multiple reflections is discussed. 2006 Optical Society of America OCIS codes: (190.4710) Optical nonlinearities in organic materials; Electro-optic polymers; (310.6860) Thin films, optical properties. References and links 1. G. A. Lindsay and K. D. Singer, eds., Polymers for Second-Order Nonlinear Optics,. (ACS Symposium Series 601, 1995). 2. D. M. Burland, R. D. Miller, and C. A. Walsh, “Second-order nonlinearity in poled-polymer systems,” Chem.