基于NiosII和USB接口的工业CT数据采集模块测试系统设计.pdf

第 30 卷 　第 6 期 电 子 器 件 Vol . 30 　N o . 6 2007 年 12 月 　　　 Chinese J our nal Of Elect r on Devices 　　 Dec . 2007 Design of a Testing System f or Industrial CT Data Acquisition Module Base on Nios II and USB Interface 1 2 2 2 2 GA O F uqi ang , J I A N G R enqi ng , L U H ua , CA O Peng , A N K ang 1. I C T R esearch Center , Chong qi ng Uni vers ity , Chong qi ng 400030 , Chi na; 2 . A utom at ion Col leg e , Chong qi ng Uni vers i ty , Chong qi ng 400030 , Chi na Abstract :To de sign a t e sting sy st em for indu st rial C T dat a acqui sition mo dule ba sed o n Nio s II soft core p roce ssor an d U SB int erf ace . Sy st em scheme de signing , har dware and soft ware de signing are di scu ssed . De signing wit h Nio s II p roce ssor help s to simp lif y sy st em st r uct ure , increa se flexibilit y of de sign and im p rove sy st em p erfor mance . P seu do int er r up t w hich co mbine s t he advant age s of int er r up t t ran sfer and bulk t ran sf er i s u sed to meet t he requirement of ma ss dat a and real time . Practical app lication show s t hat t he sy st em , wit h a t ran smi ssion byt e er ror rat e le ss t han 1 ×10 - 7 and a t ran sf er sp eed of 370 kbyt e/ s , can be succe ssf ully u sed to t e st in du st rial C T dat a acqui sition mo dule . Key words :dat a acqui sitio n ;in du st rial C T ;Nio s ;U SB int erface ;p seudo int er rup t ;bulk t ran sf er EEACC :1130 B 基于 Nios II 和 USB 接口的工业 CT 数据 采集模块测试