《《Agilent ICT - Level I》.ppt

Agilent ICT Level - I Content Defect Basic Agilent 3070 Concept Basic Agilent 3070 Concept Agilent 3070 Hardware Structure Cards in Module Support Bay, Vacuum Box, Fixture Fixture/测试夹具 Test Principle/测试原理 Shorts Opens Testing Hardware Analog Test Analog Test Capacitor Test Capacitor Test Inductor Test Diode Zener Test Diode Zener Test TestJet TestJet Setup power sub-program Digital Test Digital Test Boundary Scan HP-UNIX File Structure HP-UNIX File Structure Shell Window BT-BASIC Command BT-BASIC Command Starting a Test Analog Test Debug Board Constant Fixture Constant Pushbutton Debug Conclusion/结论 Thank you 10uA~10mA,default is10mA. Without option ”Sa,re”,”idc” will automatically choose proper ”Sa,re”. DC current idc Used in zener test should be between 0~18V. ASRU range ar To diodo“CO”should be set 1 volt grater than upper limit; to zener should be set greater than alternative source 8.99v so it should be set to 10V. Voltage compliance co Note: 1)diode test can use Guarding to avoid parallel resistance but not zener. 2)??the output of MOA can’t exceed 15VDC. Below is the option configuration between diode and zener: HP TestJet basic principle Solder open is one of the most common problems in current surface mounted printed circuit board, especially to the application of complicated integrated circuit, it is hard to detect the defect by visually inspect, also it is time and energy consuming. HP testjet technology is the patent of HP Inc. It can cover component’s solder open with vector less test. The technology of HP testjet is to measure the small capacitance between component pin and the sensor right above the component. If component pin is not well connected to the circuit board, the measured capacitance will be out of the threshold so that solder open pin can be detected. HP TestJet 测试原理 开焊问题是目前电路板表面贴装生产中最常见的问题之一，特别是对超大规模集 成电路越来越多的使用，靠人眼是很难发现的，而且费时费力。HP TestJet 技术是惠普公司的专利，它提供了一个用于元件引脚开路时的测试。对于复杂或 专用的元件的失效，可以不用测试矢量也不用对