《Basics of XRD》.ppt

In-situ XRD can yield quantitative analysis to study reaction pathways, rate constants, activation energy, and phase equilibria NaAlH4 Al NaCl Na3AlH6 Bruker D8 Triple Axis Diffractometer For GIXD and for analysis of rocking curves, lattice mismatch, and reciprocal space maps of thin films and semiconductors This instrument is typically used to measure the perfection or imperfection of the crystal lattice in thin films (i.e. rocking curves), the misalignment between film and substrate in epitaxial films, and reciprocal space mapping. High precision Bruker D8 triple axis goniometer Beam-conditioning analyzer crystals remove Ka2 radiation and provide extremely high resolution. Bruker Small Angle Diffractometer Used for SAXS high-power rotating anode X-ray source two-dimensional detector for real-time data collection A long X-ray beam path allows this instrument to measure X-rays that are only slightly scattered away from the incident beam. The two-dimensional detector allows entire Debye rings to be collected and observed in real time. The current beam path length of 60.4 cm allows the resolution of crystallographic and structural features on a length scale from 1.8nm to 40nm (1.8nm is near the maximum resolvable length scale for XRPD in our other systems). A heater is available to heat the sample up to 200°C. Bruker Single Crystal Diffractometer Designed primarily to determine the crystal structure of single crystals can also be used for determining crystal orientation This diffractometer uses a two-dimensional CCD detector for fast, high precision transmission diffraction through small single crystals. A variety of goniometer heads fit on the fix chi stage A cryostat is available to cool samples down to 100 K in air, which permits more precise determination of atom positions in large organic crystals. Back Reflection Laue Diffractometer The sample is irradiated with white radiation for Laue diffraction Use either Polaroid film or a two-dimensional multiwire