ReliabilityTestingandReliabilityPrediction.pdf

Section 3 Reliability Testing and Reliability Prediction Section 3 Reliability Testing and Reliability Prediction 3.1 What Is Reliability Testing Reliability testing is a series of laboratory tests carried out under known stress conditions to evaluate the life span of a device or system. Reliability tests are performed to ensure that semiconductor devices maintain the performance and functions throughout their life. These reliability tests aim to simulate and accelerate the stresses that the semiconductor device may encounter during all phases of its life, including mounting, aging, field installation and operation. The typical stress conditions are defined in the testing procedure described later in this document. Reliability tests are performed at various stages of design and manufacture. The purpose and contents differ in each stage. When testing semiconductor devices, (1) the subject and purpose of each test, (2) the test conditions, and (3) the judgement based on test results must be considered. Table 3.1 shows the subject, purposes, and contents of some reliability tests carried out at our laboratories. Rev. 1.00 Aug. 31, 2006 Page 35 of 410 REJ27L0001-0100 Section 3 Reliability Testing and Reliability Prediction Table 3.1 Examples of Reliability Testing Conducted When New Products are Developed Phase Purpose Name Contents Development of To verify that the design Quality approval for The following and other semiconductor reliability goals and the product developed tests are carried out as products customers reliability