IPOG A General Strategy for strongTstrong-Way Software Testing.pdfVIP

IPOG: A General Strategy for T-Way Software Testing 1 2 2 2 3 Yu Lei , Raghu Kacker , D. Richard Kuhn , Vadim Okun , James Lawrence 1Dept. of Comp. Sci. and Eng. 2 Information Technology Laboratory 3Dept. of Mathematics University of Texas at Arlington National Inst. of Standards and Tech. George Mason University Arlington, TX 76019 Gathersburg, MD 20899 Fairfax, VA 22030 Email: ylei@ Email: {raghu.kacker, kuhn, Email: lawrence@ vadim.okun}@ represents a parameter (in the sense that each entry in a Abstract column is a value of the parameter represented by the Most existing work on t-way testing has focused on 2-way column). It can be checked that each of the three pairs of (or pairwise) testing, which aims to detect faults caused by columns, i.e., columns 1 and 2, columns 1 and 3, and interactions between any two parameters. However, faults columns 2 and 3, contains all four pairs of values of two can also be caused by interactions involving more than two Boolean parameters, i.e., {00, 01, 10, 11}. If all failures of parameters. In this paper, we generalize an existing the system are triggered by faulty interactions between at strategy, called In-Parameter-Order