testUSBhighSpeedSOP..doc

USB2.0 Host High Speed Test SOP Function: SI Phase Name: Validation Document Revision: A Issue Date: 2005/09/23 APPROVED CHECKED PREPARED BY Sammy Zhang Ellen Kang DATE 2005/09/23 2005/09/23 This document contains proprietary and confidential information of Foxconn. All rights and titles hereto remain with Foxconn. The recipient shall keep this document in strict confidence and shall use this document in the manner and solely for purposes expressly agreed to by Foxconn. The recipient shall not disclose or allow access to this document, in whole or in part, by third parties, nor use it for the benefit of the recipient or third parties. The recipient shall not change this document in form and substance by any means, including without limitation, decompile, reproduce, revise, and amend. ※ ※ 修 訂 履 歷 ※ ※ REV. 發行者 修 訂 內 容 發行日期 備 註 A 初 版 發 行 2005/09/23 Table of Contents 1. Revision History…………………………………….5 2. Purpose……………………………………………...5 3. USB2.0 High Speed Test Working Instruction...7 1. Revision History Date Revision Author Description 2005/09/23 A Ellen Kang 2. Purpose High Performance to validate that product’s signal quality for downstream traffic less than the specification of USB2.0 . 3. USB2.0 Droop Test Working Instruction TEST LAB: FOXCONN ADC LAB TEST FEE TIME: 0.5 Hours. TEST CONFIGURATION: Test Instrument: TDS6604 Digital Storage Oscilloscope Test Tools: One 5G P7350 or P6248 Differential Test Fixture: TDSUSBF USB2.0 Compliance Test Fixture Without Power Adapter Equipment Under Test (EUT) Configuration: per actual test requirement on USB2.0 Test Fixture Test Program: TDSUSB2.0 Test Package Application TEST CONDITION: All of the host PC’s