l集成电路芯片测试仪的设计.doc

摘 要 集成电路（IC）测试是伴随着的发展而的，数字芯片在使用过程中容易被损坏，肉眼不易观察因此很需要设计能够测试芯片好坏的仪器。本系统以AT89C52为核心,由键、显示、电源控制模块等组成根据数字以及集成芯片的真值表测试程序能完成TTL74、54系列数字集成芯片的功能测试。 ABSTRACT Integrated circuit (IC) test is accompanied with the development of electronic technology, Digital integrated chip is easily damaged during use, and difficult to observe with the naked eye. Early manual test methods for some high integration, the logic of complex digital integrated circuits become difficult，thus gradually replaced by automated testing, so it is necessary to design a testing instrument to distinguish the Common chips is good or bad conveniently. The system is with AT89C52 microcontroller at the core, including the chip test socket，, 74HC573drives an 8-bit digital display, 5V DC power supply control module and other components, etc. According to the characteristics of digital IC pins and the truth table write integrated chip test program. The system can be completed within 14 feet common TTL74, 54 series digital integrated chip functional test. Keywords: tester; digital integrated circuit; microprocessor control unit 目录 系统总体方案…………………………………………………………………………..1 2 系统硬件电路设计……………………………………………………………..............2 2.1 硬件系统电路原理框图…………………………………………………………...2 2.2硬件系统电路各模块设计…………………………………………………………2 2.2.1 MCS-52单片机最小系统……………………………………………………2.2.2 独立按键模块………………………………………………………2.2.3 芯片测试模块……………………………………………………………………………………………………………………......................5 2.2.5 电源供电模块…………………………………………………………..........7 3 系统软件设计……………………………………………………………………TTL74系列芯片……………………………………………………………………….........8 3.3 程序流程图…………………………………………………………………….........9 3.4 模块程序关键代码…………………………………………………………….......11 3.4.1 主程序…………………………………………………………………………………………………………………………………11 3.4.3 74HC573控制数码管显示程序……………………………………………3.4.4 信号检测程序……………………………………………………………………………………………………………………………………........19 总结………………………………………………………………………………………..21 致谢………………………………………………………………………………………..22 参考文献…………………………………………………………………………………..23 附录………………………………………………………………………………………