X射线萤光光谱仪(XRF)检验规范讲解.doc

機密等級: 機密 USI Controlled Document Confidential Level: Confidential Document Title(文件名稱) : X-Ray fluorescence test specification (X射線螢光光譜儀(XRF)檢驗規範) Document Number(文件編號): AT-0801-M427 Revision(文件版本): A6 Revise Date: 6/26/2009 Prepared by(撰寫者): Edwin Huang 黃基泉 Create by which Unit(制定單位) : CQM/GRM/GD AG-0801-M006-F2 Rev.:A1 Amendment Records Item: Date: Revision: Page: Change Description: Changed by: 1 03/31/2005 A2 6,7 1.Delete the Cr from the item of XRF test. 2.Add remark. Eric Chang 2 04/10/2006 A3 7 1.Add remark 3 Eric Chang 3 04/10/2006 A3 6 包裝材料的測試值修改為: 鉛+汞+鎘+铬需小於100ppm,其中需鎘小於5ppm 4 05/05/2006 A1 All Coding change from TT-0801-Q095 to TT-0801-M401 Eric Chang 5 05/05/2006 A1 6,7 修改附件一XRF測試零件及產品類別之有害物質限值表規格Pb, Cr, Hg: 700ppm，增加Cd:60ppm之管制 刪除Remark對Cr Eric Chang 6 07/05/2006 A1 All 1. Document coding change from TT-0801-M401-A1 to AT-0801-M427-A1. 2. Add the purpose and scope. Ken Ke 柯炤榕 7 11/30/2006 A2 2,4,11 1. Omit that this program is practicable in Taiwan and China sites. 2. Modify Method 3: test point of PCB. 3. Remove Package item on attachment 1: the Cd must under 5 ppm. Edwin Huang 8 04/29/2008 A3 10,12 1. Add halogen free and Spot test items. 2. Delete Br controlling item. Edwin Huang 9 08/20/2008 A4 1,10, 12~14 1. Add attention items for the tool management process of mechanical preparation. 2. Add the flow chart and form for the management process to attachment. Edwin Huang 10 09/04/2008 A5 10~12 Updated Attachment 1: EHS threshold value of component type for XRF test Edwin Huang 11 06/26/2009 A6 10 11 12 14 Add test method if customer request Delete” IQC won’t control the threshold value of Cl.. Add “If the material composed of metal, glass and ceramic. The component won’t be carried out halogen free.. Updated AT-0801-M427-F1 to A2 version. Edwin Huang AG-0801-M006-F3 Rev.:A1 目