MICROPROCESSOR DESIGN ISSUES TO FULLY EXPLOIT SHRINKING FEATURE SIZES AND AVOID BEING OVERW.pdf
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MICROPROCESSOR DESIGN ISSUES TO FULLY EXPLOIT SHRINKING FEATURE SIZES AND AVOID BEING OVERW
2Deep-submicron technology allows
billions of transistors on a single die, poten-
tially running at gigahertz frequencies.
According to Semiconductor Industry Asso-
ciation (SIA) projections,1 the number of tran-
sistors per chip and the local clock frequencies
for high-performance microprocessors will
continue to grow exponentially in the near
future, as Figure 1 illustrates. This ensures that
future microprocessors will become ever more
complex.
However, physical and program behavioral
constraints will limit the usefulness of this
complexity. Physical constraints include inter-
connect and device limits, as well as practical
limits on power and cost. Program behavioral
constraints result from program control and
data dependencies, and from unpredictable
events during execution.
Other challenges include the need for
advanced CAD tools to combat the negative
effect of greater complexity on design time.
Designers will also have to make improve-
ments to preserve computational integrity,
reliability, and diagnostic features. Successful
implementations will depend on the proces-
sor architect’s ability to foresee technology
trends and understand the changing design
trade-offs for specific applications, beginning
with the differing requirements for client ver-
sus server processors. This article discusses
these trade-offs in light of industry projections
and the many considerations affecting deep-
submicron technology.
Limits of technology scaling
Improved microprocessor performance
results largely from technology scaling, which
lets designers increase the level of integration
at higher clock frequencies. While current
implementations use feature sizes of about
0.25 micron, devices with feature sizes small-
er than 0.1 micron are expected in the next
few years. Table 1 shows projected specifica-
tions through 2012. As feature sizes shrink,
device area shrinks roughly as the square of
the scaling factor. Meanwhile, device propa-
gation delay (under constant field assu
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