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Surface inspection by optical triangulation
Surface inspectiofl b optical triangulation
Manuel F. M. Costa
Universidade do Minho, Departamento de FIsica
Tel. +351 53 604327(/20); Fax. +351 53 604339(/92)
P-4719 BRAGA CODEX PORTUGAL
ABSTRACT
We will descnbe an optical non contact microtopographer based on an active, discrete
triangulation procedure, showing that this kind of triangulation based surlace inspection system can be
applied, not only to large distance range sensing, but also to smaller samples or smother surfaces with
resolutions that can be driven down to the sub micron range.
In our system the topographic information is obtained from the horizontal shift incurred by the
bright spot created, by an oblique collimated light beam, on a surface when it is displaced vertically. A
laser beam is focused onto a small, diffraction limited, spot on the surface and is made to scan it over
the desired region. The horizontal position of the bright spot is perpendicularly imaged onto a linescan
camera and the information about the individual detectors that are activated, above a certain
controllable intensity threshold level, is used to compute the corresponding horizontal spots shift on the
reference plane. Thus we can compute the distance between the surface and a reference plane at
each sampled point. A map of the surface topography can then be built and statistical surtace
characterization parameters may be calculated.
Our laboratory setups configuration is quite versatile and it has been used for different
inspection tasks like: thickness measures and relief mapping of polyethylene films and thin sputtered
cooper, tin dioxide and silver films, several kinds of fabrics; and roughness measure and topographic
inspection of polyethylene molds and graphite samples.
Presented will also be the portable version of our system and also the setup for large distance
dimensional assessment.
1. INTRODUCTION
In modem manufacturing quality control requirements are stringent and the subjective, although
valuable, human visu
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