Yield stress influenced by the ratio of wire diameter to grain size.pdf

This article was downloaded by: [Bo Yang] On: 04 June 2012, At: 22:27 Publisher: Taylor Francis Informa Ltd Registered in England and Wales Registered Number: 1072954 Registered office: Mortimer House, 37-41 Mortimer Street, London W1T 3JH, UK Philosophical Magazine Publication details, including instructions for authors and subscription information: /loi/tphm20 Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires B. Yang a b , C. Motz b , M. Rester c G. Dehm b c a Materials Center Leoben Forschung GmbH, Leoben, Austria b Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria c Department of Materials Physics, Montanuniversit?t Leoben, Leoben, Austria Available online: 29 May 2012 To cite this article: B. Yang, C. Motz, M. Rester G. Dehm (2012): Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires, Philosophical Magazine, DOI:10.10802012.693215 To link to this article: /10.10802012.693215 PLEASE SCROLL DOWN FOR ARTICLE Full terms and conditions of use: /page/terms-and- conditions This article may be used for research, teaching, and private study purposes. Any substantial or systematic reproduction, redistribution, reselling, loan, sub-licensing, systematic supply, or distribution in any form to anyone is expressly forbidden. The publisher does not give any warranty express or implied or make any representation that the contents will be complete or accurate or up to date. The accuracy of any instructions, formulae, and drug doses should be independently verified with primary sources. The publisher shall not be liable for any loss, actions, claims, proceedings, demand, or costs or damages whatsoever or howsoever caused arising directly or ind