模拟电路性能退化型故障诊断方法研究_马翔楠.pdf

27 1 Vol. 27 No. 1 32 JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT 2013 1 DOI: 10.3724/SP.J.1187.2013.00032 * ( 310027) : , , , , , , 7.76%, : ; ; ; ; + : TP306 .3 : A : 510.10 Research on degraded fault diagnosis method for analog circuit Ma Xiangnan Xu Zhengguo Wang Wenhai Sun Youxian (Zhejiang University, Hangzhou 310027, China) Abstract: To diagnosis degraded fault for linear analog circuits, through constructing a comparison circuit, a new fault dictionary based on voltage sensitivity analysis of node is established. Then fault localization and fault parameter identifi- cation are realized for multiple faults case. The fault components can be localized and identified by analyzing the voltages of available test-points. The simulation results demonstrate that the average error of fault parameter identification is 7.76% , and the effectiveness of the proposed approach is verified. Keywords: analog circuit; fault diagnosis; sensitivity; decomposition method; degradation [9-12], , 1 , 20 60 Berkowitz[1] , , , , , , Tadeusiewicz , [2-5] [6-8] : [10] , , , ,