BaBi4-xLaxTi4O15 介电弛豫.pdfVIP

Journal of Alloys and Compounds 497 (2010) 416–419 Contents lists available at ScienceDirect Journal of Alloys and Compounds j o u rn al h omepage: w w w. elsev /locate/jallcom The microstructure and dielectric relaxor behavior of BaBi La Ti O 4−x x 4 15 ferroelectric ceramics Pinyang Fang, Huiqing Fan ∗ , Jin Li, Lei Chen, Fujun Liang State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi’an 710072, China a r t i c l e i n f o a b s t r a c t Article history: Ferroelectric ceramics BaBi La Ti O (BBLT) were prepared with a solid-state reaction process. The 4−x x 4 15 Received 8 November 2009 obtained phases were confirmed as the Bi-layered perovskite phase with orthorhombic structure by the Received in revised form 4 March 2010 X-ray diffraction analysis (XRD). The dielectric relaxation was studied as a function of temperature and Accepted 8 March 2010 frequency. A dispersion of the maximum dielectric constant (εmax ) appears around the temperature of Tm , Available online 15 March 2010 which shifts toward higher temperatures with the increase of frequency. The modified Curie–Weiss (CW)