一种面向单粒子效应的容错自动转换工具.pdf

第 1 1 卷 第 1 4期 中国 科 技 论 文 Vol. 11 No. 14 2016 年 7 月 CHINA SCIENCEPAPER Jul. 2016 一种面向单粒子效应的容错自动转换工具 盖璐璐，徐建军，邓锦洲，邵则铭 (国防科学技术大 学计算机学院 ，长 沙410073) 摘 要 ：空间环境下高能粒子辐射所产生的单粒子效应是半导体电路中的1 种瞬态故障现象，是影响航天计算机可靠性的重要 原因。与硬件加固技术相比, 针对单粒子效应的软件容错技术由于在实现成本和灵活性等方面的优势而备受关注。而自动化 工具能提高容错加固的效率，拓展软件容错技术的应用范围。本文面向D SP 线性汇编程序,设计实现了一种容错自动转换工具 AFTCT 。AFTCT 能够实现程序分析和容错转换功能。同时，该工具能够集成多种容错算法，对新算法具有很好的扩充能力。 并且结合JPEG2000 程序对转换后代码进行了测试验证。 关键词 ：单粒子效应；软件容错；线性汇编；程序转换 中图分类号:TP306十. 3 文献标志码：A 文章编号= 2095 - 2783(2016)14- 1594 - 06 Fault tolerance automatic conversion tool for single event effects GAI Lulu, XU Jianjun, DENG Jinzhou, SHAO Zeming {College o f Com puter National U niversity o f D efen se T ech n ology Changsha 410073 ^ China) Abstract ：Single Event Effects (SEEs) are a kind of transient fault phenomenon in semiconductor circuit, which is caused by the external radiation from the high energy neutrons from cosmic rays, and etc. SEEs are always one of vital reasons for affecting the reliability of space computers. Comparing with the hardware-implemented fault tolerance for SEEs^ the software-implemented methods are attractive because of their advantage on costs and flexibility. The automatic tools will improve the efficiency of radia­ tion harden, and extend the applicability of fault tolerance techniques. For the DSP linear assembly programs， this paper presents a fault tolerance automatic conversion tool for SEEs, named AFTCT. AFTCT implements a linear assembly program analysis function and he fault-tolerant conversion function At the same time, the tool can integrate a variety of fault-tolerant algorithm, and have good expansion capability to the