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平面工艺IGBT制作及导通压降的PIN模型计算
44 5 V o.l 44 N o. 5
2009 10 JOU RNAL OF SOUTHW EST JIAOTONG UN IVER SITY O ct. 2009
: 025 8-2724 2009) 05-0648-06 DOI: 10. 3969 / j. issn. 0258-2724. 2009. 05. 004
IGBT
PIN
袁寿财, 刘亚媚
, 34 1000)
: , IGBT , -
, 3. 7 ~ 4. 8 V . IGBT P IN
, . : ;
, , 8% .
: ; ; ; P IN ;
: TM 205 : A
Planar IGBT Fabrication and
ForwardVoltageDrop Calculated by PINModel
YUAN Shouca i, L I U Yam ei
Schoo l of Phys ics and E lectronics Inform a tion, G annan N o rm al U niversity, G anzhou 34 1000, Ch ina)
Abstract: IGBT insulate gate b ipo lar transistor) dev ices w ith planar processes w ere designed and
fabricated based on planar silicon CMOS com p lmi entary m eta l ox ide sem iconductor ) techno logy
equ ipm ents and ep itax ia l silicon substrates. T he m easured ou tput current-vo ltage characteristics o f the
fabricated IGBT dev ices are excellent, and the ir thresho ld vo ltage is from 3. 7 to 4. 8 V. T he forw ard
vo ltage drop s of the IGBT dev ices w ere ana lyzed and ca lculated by P IN diode a p-type near intrinsic
and an n-type sem iconductor) mode l w ith the ir designed structure and process param eters, and the
calculated forw ard voltage drop s w ere com pared w ith the m easured data. T he com parison resu lt show s
that they are fitting better w hen conducted curren ts are sm all, but there ex ist differences bewt een the
calculated and m easured forw ard vo ltage drops due to m odel smi
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