TEM中电子衍射相机长度的实验分析及计算 - 南京师范大学学报（工程.PDF

4 () Vo.l No. 4 200 12 JOURNAL OF NAN JING NORMAL UN IVERSITY ( ENG INEERING AND TECHNOLOGY EDIT ION ) Dec, 200 TEM 中电子衍射相机长度的实验分析及计算 王兴和, 周延怀 (, 210097) [] ( Transm isson E lectronM icroscopy, TEM ) , . ( Bragg), TEM , TEM , TEM , TEM . TEM , TEM . [] , , , + [] O4 3 . 1 [] B [ ] 1 72-1292( 200 ) 04-0071-04 Experim en tal Analy sis and Calculation of E lectron D iffraction Cam eral L ength in TEM W ANG X inghe, ZHOU Yanhua i ( School of Physica lScience and Technology, N anjing Norm alUniversity, Nanjing 210097, China) A bstract: The cam era length of electron diffraction in transm isson electron m icroscopy (TEM ) is one of the m ain techn ical param eters in designing electron m icroscope and the electron diffraction analysis tom icrocrystal sam ple. A c- cord ing to B ragg law, the formu la of calculating TEM electron diffraction cam era length is derived from the research on the ray path of electron diffraction mi ages in TEM and the com parison on electron diffractionw ith ord inary electron- ic diffractom eter. The difference of physical sign ificance of electron d iffraction cam era length bewt een TEM and ord-i nary electronic diffractom eter is d iscussed. The resolution index of electron d iffraction in TEM is analyzed. The exact- ly expermi entalm ethod is given for dem arcating electron d iffraction camera length by Gold-m onocrystal in TEM. K ey w ord s: TEM, electron diffraction, cam eral length, cam eral consten t 0 引言 , , TEM . , TEM , TEM . TEM , TEM . 1 电子衍射的基本原理 1, hkl , 2, : 200 -05-12. : ( 1957-), , . E-m ail: w angxinghe@ njnu. edu. cn