Lecture 4 Scanning Probe Microscopy (SPM)（讲座4扫描探针显微镜(SPM)）.pdf

Lecture 4 Scanning Probe Microscopy (SPM) • General components of SPM; • Tip the probe; • Cantilever the indicator of the tip; • Tip-sample interaction the feedback system; • Scanner piezoelectric movement at x,y,z; • Measurement artifacts: vibration must be isolated. Basic components of SPM: tip, cantilever, sensor for tip positioning, scanner, feedback loop (electronic control) Generation of SPM image X-Y raster scanning; Z-modulation (height) by feedback system. SPM Family SPM Tip-Sample Electrical Current AFM + Optical Microscopy Tip-Sample Interaction STM AFM NSOM Mechanic Force: Extremely high • Contact mode Resolution at UHV. • Non-contact mode Scanning Confocal • Tapping (intermittent) mode Other Interactions: • Electrostatic mode (scanning electrostatic potential microscope) • Magnetic mode • Chemical Force mode Basic components of STM: The scanner can be Five basic components: mounted with the tip or the sample stage. 1. Metal tip, 2. Piezoelectric scanner, 3. Current amplifier