ADC并行交替采样与校正技术专题讨论.doc

ADC并行交替采样与校正技术专题讨论 本 科 生：丁嘉裕 专 业：电子信息工程 研究方向：电子测量技术 学 号： 2011021192 二 ○ 一 四 年 四 月 ADC并行交替采样与校正技术专题讨论 专业名称　　电子信息工程 论文提交日期 　2014年4月　　 学校名称　成都信息工程学院（　　2014　年　　4　月） 二○一四年四月 ADC并行交替采样与校正技术专题讨论 摘　　要 关键词：并行采样，误差分析 目前,现代电子信号呈现出复杂化、多样性的特征,特别是宽带和非平稳特性的增长极为迅速,以扫频为主的频域测试仪器已经越来越难以满足宽带、瞬态信号的无缝测试要求。随着ADC取样带宽的增长和DSP理论与技术的日益成熟,基于实时取样的时域测试技术,正在成为电子测试发展的主流,也孕育着电子仪器体系的重要变革。高精度采样已经成为现代时域测试仪器的瓶颈问题。采样速率、采样精度越高At present, the modern electronic signal shows the characteristics of complexity, diversity, especially the growth of broadband and non-stationary characteristics is very rapid, predominantly sweep frequency domain testing instruments have become increasingly difficult to meet seamless broadband, transient signal testing requirements. As the growth of the ADC sampling bandwidth and DSP’s theory and technology becoming more mature, based on the real-time sampling time domain measurement technology, is becoming the mainstream of the development of electronic testing, electronic instrument system also expecting important change. High precision sampling has become a bottleneck problem of modern time domain testing instruments. Sampling rate, the higher the sampling precision, the stronger the reducing power of the signal, the ADC sampling rate has greatly improved in recent years, but it is still difficult to give attention to both high speed and high precision, it is at this stage simulator that limit, the manufacturing process to real-time breakthrough the bottleneck, the only way is parallel multi-channel technology the Time - interleaved alternately mode, namely the front parallel sequential sampling back-end serial multiplexing. Alternating sampling technology is the only time there is no limit to an input signal real-time sampling technology, can break through the AD converter and the associated device working speed limit, ultra high speed data acquisition system. 目 录 第1章 绪论 1 1.1 研究背景 1 1.2 并行采样 2 并行采样优点 3 并行采样缺点 3 并行采样误差来源 3 误差影响的采集性能 4 第2章 通道失配误差校 4 第3章 时间偏差和带宽失配误差