短间隙短路放电的场增强因子研究.PDF

35 9 第 卷 第 期 真 空 科 学 与 技 术 学 报 2015 9 CHINESE JOUＲNAL OF VACUUM SCIENCE AND TECHNOLOGY 年 月 1035 短间隙短路放电的场增强因子研究 1，2 1* 1 1 钟久明 刘树林 段江龙 王玉婷 (1. 西安科技大学电气与控制工程学院 西安 7 10054 ;2. 海南师范大学物理与电子工程学院 海口 57 1158) Field Enhancement Factor in Short-Circuit Discharge Across Narrow-Gap Zhong Jiuming1，2 ，Liu Shulin1* ，Duan Jianglong1 ，Wang Yuting1 (1. School of Electrical and Control Engineering ，Xi ’an University of Science ＆ Technology ，Xi ’an 7 10054 ，China ; 2. School of Physic and Electronics Engineering ，Hainan Normal University ，Haikou 57 1158 ，China) Abstract The short-circuit discharge ，occurring at the narrow gap between the electrodes of W-wire and Cd- disc of the safety spark test apparatus specified by international electrical commission (IEC-SSTA)，was empirically approximated ，mathematically modeled ，theoretically analyzed and experimentally evaluated． The impact of the mi- crostructures of the side surfaces of the Cd-disc ，covered with various scraps because of the contacts，as shown in its scanning electron microscopy images，on the field emission was investigated． To begin with ，the rough side-surfaces of the Cd-cathode were approximated as the uniformly distributed array of micro-domes ，a few microns in diameter ; next ，the static potential ，around an individual micro-dome ，was estimated by solving Laplace ’s equation ;and final- ly ，the field enhancement factors ， and ，were derived with F-N formula． The effective field enhancement factor β 0 β 1