DAC测试原理介绍V93000.ppt

Sample Footer Text DAC Test DAC Test Static Test Dynamic Test DAC Static Test Contents DAC Static Performance Specifications DAC Test Methodology DAC Static Performance Specifications Differential Non-Linearity (DNL) Integral Non-Linearity (INL) Offset Error Gain Error Gain Mismatch DAC Differential Non-Linearity, DNL Intepretating DC Transfer Characteristics DAC Integral Non-Linearity, INL DAC Offset Error (Zero Error) DAC Gain Error (Full Scale Error) DAC FS Gain Error Calculations DAC LSB Gain Error DAC LSB Gain Error Calculations DAC Gain Mismatch One Sentence Summary DNL is a measure of the worst case deviation from the ideal 1 LSB step. INL is Worst case deviation from the line between the endpoints (zero and full scale). Offset Error is the linear displacement at code V(0). FS Gain error is the displacement of the maximal code. Gain Mismatch is the FS code deviation between multiple DACs. DAC Test Methodology Configuration Testing DAC Static Parameters Creating the DAC Output Signal DAC Output Ramp Signal from zero scale to full scale Create Digital Vector for Output Signal Capturing the DAC Output Signal Setup Digitizer Sampling Frequency Fs Send the waveform data to the DSP to perform DNL/INL DAC Static Test – Sampling Methodology Linearity Test Result Test Example Test condition : 8 bit DAC THS5641A, Sampling Rate of the device is 27MHz DAC Dynamic Test Contents DAC Dynamic Performance Specifications DAC Test Methodology DAC Dynamic Performance Specifications Transmission Parameters DAC Dynamic Performance Specifications Total harmonic distortion (THD) Signal-to-noise plus distortion (SND) Signal-to-noise ratio (SNR) Spurious free dynamic range (SFDR) Signal resolution Signal Spectrum Components Total Harmonic Distortion, THD Signal-to-Noise Ratio, SNR Signal-to-Noise plus Distortion, SND (SINAD) Spurious Free Dynamic Range, SFDR Signal Resolution DAC Test Methodology Single Tone Analysis Dual-tone Analysis Multi-tone Analysis Glitch