（毕业设计论文）《DA芯片测试系统的设计》.doc

密 级 学 号 070270 毕 业 设 计（论 文） D/A芯片测试系统的设计 院（系、部）： 机械工程学院 姓 名： 易成龙 班 级： 测 专 业： 测控技术与仪器 指导教师： 林顺英 教师职称： 讲师 2011年06月15日·北京 摘 要 随着计算机技术和微电子技术的迅速发展，D/A芯片测试系统的应用越来越广泛。测试过程应用于D/A芯片的制造过程，其主要目的都是为D/A芯片质量与可靠性提供一种度量。 本文介绍了D/A芯片测试的重要地位，分析了芯片测试系统的发展和现状，提出了相应的设计方案。系统选择美国NI公司的数据采集卡（NI-DAQ）PCI-6221对待测参数进行采集，应用LabVIEW编程语言对该测试系统的控制部分以及结果比对部分进行了设计，最终实现了一个闭环的测试系统的设计并给出测试结果。 与传统的测试方法相比，设计更开放与灵活，便于修改，成功的实现了数字端口的控制，模拟量的采集以及结果的比对与显示。 关键词：数模转化，虚拟仪器，LabVIEW，数据采集 Abstract With the rapid development of the computer technology and microelectronics technology, D/A chip-testing systems are used more widely. The testing process are used in D/A chip process, Main purpose is to provide a measure for D/A chip quality and reliability. The article introduces the important role of the D/A microchip testing and analyzes the chip test system development and situation. It also puts forward the corresponding design scheme. The system uses data acquisition card to collect the measuring parameters and choose America NI company’s data collection card (DAQ)M series NI-models :PCI6221 for acquisition signal equipment, applies the LabVIEW programming software for the test system software parts, the control parts and the result.The LabVIEW realizes the design of closed loop testing system and gives out the results. Compared with the traditional test methods, it is more open and flexible, easy to modify. It makes the design of digital control ports, analog capture and compare and display the results succeed. Key words: Analog-to-digital conversion， HYPERLINK app:ds:virtual%20instrument \t _self virtual instrument，LabVIEW Electromagnetic interference，Data acquisition 目 录 第一章 前沿································································1 1.1 课题背景及研究意义················································1 1.1.1现代工业生产的热点研究···········································1 1.1.2测试系统设计技术的产生···········································2 1.2