February 4, 2009课件.ppt

精品文档 Comparison Between 1-Step Diagnostic ILP Run and 2-Phase Method Complete Diagnostic Test Set 4-b ALU c17 c432 c880 精品文档 Results SUN Fire 280R, 900 MHz Dual Core machine ATPG – ATALANTA Fault Simulator – HOPE AMPL Package with CPLEX solver for formulating and solving Linear Programs 精品文档 Circuit No. of Faults Fault Coverage % Test Minimization LP [1] Detection Test Set Diagnostic Characteristics No. of Unoptimized Vectors Minimal detection tests No. of Undiag. Faults No. of CEFS Maximum Faults per Syndrome 4b ALU 227 100 270 12 43 19 4 c17 22 100 32 4 6 3 2 c432 520 99.24 2036 30 153 68 9 c499 750 99.24 705 52 28 12 3 c880 942 100 1384 24 172 83 4 c1355 1566 99.49 903 84 1172 531 5 c1908 1870 99.52 1479 107 543 248 17 c2670 2630 95.74 4200 70 833 316 11 c3540 3291 96.01 3969 95 761 313 8 c5315 5291 98.90 1295 63 1185 527 8 c6288 7710 99.56 361 16 2416 1122 6 c7552 7419 98.25 4924 122 1966 891 7 Phase-1: Finding Minimal Detection Test Set 精品文档 Phase-2: Finding Additional diagnostic vectors using Diagnostic ILP Circuit No. of Unoptimized Vectors No. of Faults No. of Constraints Minimized vectors CPU s 4b ALU 258 43 30 6 1.36 c17 28 6 3 2 1.07 c432 2006 153 101 21 3.03 c499 653 28 10 2 1.09 c880 1358 172 41 7 2.74 c1355 1131 1172 12 2 2.13 c1908 819 543 186 21 3.16 c2670 4058 833 383 51 5.29 c3540 3874 761 146 27 8.45 c5315 1232 1185 405 42 15.35 c6288 345 2416 534 12 50.13 c7552 4802 1966 196 31 9.35 精品文档 Diagnostic Characteristics of Minimized Complete Diagnostic Test Set 1 Circuit 2 Total Vectors 3 No. of Faults 4 Uniquely Diagnosed Faults 5 No. of CEFS 6 Undiag. Faults (3 – 4) 7 No. of Syndromes (4 + 5) 8 Maximum Faults per Syndrome 9 Diagnostic Resolution 4b ALU 18 227 227 0 0 227 1 1.000 c17 6 22 22 0 0 22 1 1.000 c432 51 520 488 16 32 504 2 1.032 c499 54 750 726 12 24 738 2 1.016 c880 33 942 832 55 110 887 2 1.132 c1355 86 1566 397 532 1169 929 3 1.686 c1908 127 1870 1380 238 490 1618 8 1.156 c2670 121 2630 2027 263 603 2290 11 1.149 c3540 122 3291 2720 2