TEM用语集-样品等样品及制样.pdf

  1. 1、本文档共24页,可阅读全部内容。
  2. 2、有哪些信誉好的足球投注网站(book118)网站文档一经付费(服务费),不意味着购买了该文档的版权,仅供个人/单位学习、研究之用,不得用于商业用途,未经授权,严禁复制、发行、汇编、翻译或者网络传播等,侵权必究。
  3. 3、本站所有内容均由合作方或网友上传,本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺!文档内容仅供研究参考,付费前请自行鉴别。如您付费,意味着您自己接受本站规则且自行承担风险,本站不退款、不进行额外附加服务;查看《如何避免下载的几个坑》。如果您已付费下载过本站文档,您可以点击 这里二次下载
  4. 4、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等,请点击“版权申诉”(推荐),也可以打举报电话:400-050-0827(电话支持时间:9:00-18:30)。
查看更多
TEM 用语集- 样品等(样品及制样) 1.ion etching keyword “ ion etching ” Ion etching is a technique to selectively remove specific atoms and the atoms at lattice defects. This technique is used for observation of textures on a specimen surface. A technique of uniform and nonselective thinning for specimen preparation of TEM is ion milling. Sometimes, ion etching is confused with ion milling. Related term ion milling 2. ion cleaner keyword “ion cleaner ” An ion cleaning tool that removes contaminants on a TEM specimen, which are residual substances deposited on a specimen at specimen pre-treatment, and contaminated substances deposited on a specimen in specimen storage. The specimen holder on which a specimen is set is inserted into an ion cleaner. Then, a glow discharge due to residual gasses in the ion cleaner is generated and the ionized gasses by discharge irradiate the specimen. This chemical-reaction of the ionized gasses removes the contaminants (in particular, polymerized substances of hydrocarbons) deposited on the specimen. Related term contamination plasma cleaning 3. ion sputtering keyword “ion sputtering ” Ion sputtering is a phenomenon where atoms are sputtered from a solid surface when ionized and accelerated atoms or molecules hit the solid surface. This phenomenon is utilized for formation of a thin film on a solid surface, specimen coating and ion etching. In the case of specimen coating, discharge is generated in a low vacuum or in an Ar gas environment under a vacuum, the ionized gas is accelerated and hits a target material (Au, Pt, etc.) at the anode. Then, the material is emitted from the target surface and deposit on a specimen at the cathode, specimen being coated. Related term focused ion-beam milling FIB 4-1

文档评论(0)

zhaohuifei + 关注
实名认证
内容提供者

该用户很懒,什么也没介绍

1亿VIP精品文档

相关文档