RLSZC000699780003 捷仕美 镀锡端子 RoHS 2010.10.21.pdfVIP

Test Report Report No.:RLSZC000699780003 Page 1 of 4 Applicant :JUST MAKE ELECTRONICS CO.,LTD Address :XI NIU PI INDUSTRIAL ESTATE, DA LANG TOWN ,DONGGUAN Report on the submitted sample(s) said to be: Sample Name :镀锡端子 Sample Description :Metal with silver color plating Part No. :Please refer to the next page Item/Lot No. :2010101201 Material :Cu, Sn Buyer :SAMSUNG, SONY Supplier :台湾JMT Manufacturer :台湾第一伸铜 Sample Received Date :Oct. 14, 2010 Testing Period :Oct. 14, 2010 to Oct. 21, 2010 Test Requested :1.As specified by client, to determine the Lead, Cadmium and Mercury content in the submitted sample and it was tested as a whole. 2.As specified by client, to identify if there is the Hexavalent Chromium in the submitted sample. Test Method: Measured Tested Item(s) Test Method MDL Equipment(s) Lead (Pb) IEC 62321:2008 Ed.1 Sec.9 ICP-OES 2 mg/kg Cadmium (Cd) IEC 62321:2008 Ed.1 Sec.9 ICP-OES 2 mg/kg Mercury (Hg) IEC 62321:2008 Ed.1 Sec.7 ICP-OES 2 mg/kg Hexavalent Chromium (Cr(VI)) IEC 62321:2008 Ed.1 Annex B UV-Vis / Test Result(s): Please refer to the following page(s). Tested by Inspected by Approved by