器件级加速退化JEITA EDR-4708B 2017 Guideline for IC Reliability Qualification Plan.pdf

器件级加速退化JEITA EDR-4708B 2017 Guideline for IC Reliability Qualification Plan.pdf

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JEITA Technical Report of Japan Electronics and Information Technology Industries Association JEITA EDR-47088 =F-i*~~@]Jl ~*itt~:fEjj 1 ~- 71 / Guideline for IC Reliability Qualification Plan 2011 iF 4 Fllfilj:;:E: 2017 iF 1 Fl :iE 1-F .nJ(; -¥~i*i~*ii11f.ifif.jJj\~ ~~ Semiconductor Reliability Technical Committee ~ fr -att~$A~~m~a••••~ Japan Electronics and Information Technology IndustriesAssociation In case of a disagreement between the tra nslation and the original version of the standard or technical report in Japanese, the original version will prevail. © JEITA :2017- Copyright- all reserved No part of th is publication may be reproduced or utilized in any form or by any means without permission in writing from the publisher. JEITA EDR-47086 Table of Contents Page 1 Purpose ... .. .. .. .. ... . ... ... .. .. .. ... 1 2 Scope of application · · · ···· ·· ··· ····· · · · · ·· ··.. ··· · · ······· ·· ········ · ·············· · · ··· · ···.. ··.. ··.. · ······.. ·· · ·· 1 3 Quality grades and applications ···················· ························································· ·· · 1 3.1 Definition of quality grades (examples) ··································································· ·· 3 4 Failure distribution ··· ··· · ········ · · · ··· ·

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