AEC - Q101 Rev - C Stress Test Qualification For Discrete Semiconductors - complete document with test methods分立器件应力试验.pdf
- 1、本文档被系统程序自动判定探测到侵权嫌疑,本站暂时做下架处理。
- 2、如果您确认为侵权,可联系本站左侧在线QQ客服请求删除。我们会保证在24小时内做出处理,应急电话:400-050-0827。
- 3、此文档由网友上传,因疑似侵权的原因,本站不提供该文档下载,只提供部分内容试读。如果您是出版社/作者,看到后可认领文档,您也可以联系本站进行批量认领。
查看更多
AEC - Q101 - REV - C
June 29, 2005
STRESS TEST QUALIFICATION
FOR
AUTOMOTIVE GRADE
DISCRETE SEMICONDUCTORS
Automotive Electronics Council
Component Technical Committee
Acknowledgment
Any document involving a complex technology brings together experience and skills from many sources.
The Automotive Electronics Counsel would especially like to recognize the following significant
contributors to the development of the C revision to this document:
Robert V. Knoell Visteon Automotive Systems
Jeff S. Price Delphi Corporation
Brian Jendro Siemens VDO Automotive Electronics Corp.
Mark A. Kelly Delphi Corporation
Werner Kanert Infineon
Arthur Chiang Vishay-Siliconix
Gary B. Fisher Johnson Controls
Jean Clarac Siemens
Jeff Jarvis United States Army
Jeff Parker International Rectifier Corp.
John Timms Motorola
Mark Gabrielle ON Semiconductor
Michael Clark Johnson Controls
Ted Krueger Vishay-General Semiconductor
Zhongning Liang Philips Semiconductor
NOTICE
AEC documents contain material that has been prepared, reviewed, and approved through the AEC
Technical Committee.
AEC documents are designed to serve the automotive electronics industry through eliminating
misunderstandings between manufacturers and purchasers, facilitating interchan
您可能关注的文档
- AEC - Q101-006 - Rev- 12V系统智能电源设备的短路可靠性表征 - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems.pdf
- AEC - Q101-005 - Rev- - Charged Device Model - CDM - Electrostatic Discharge Test-静电放电测试.pdf
- AEC - Q101-004 - Rev- - Miscellaneous Test Methods其他测试方法.pdf
- AEC - Q101-003 - Rev-A - Wire Bond Shear Test线材粘结剪切试验.pdf
- AEC - Q101-002 - Rev-A - Machine Model - MM - Electrostatic Discharge Test设备模型 -静电放电试验.pdf
- AEC - Q101-001 - Rev-A - Human Body Model - HBM - Electrostatic Discharge Test人体模型 -静电放电试验.pdf
- AEC - Q101_Rev_E_Stress Test Qualification For Discrete Semiconductors - base document only with no test methods 分立器件应力.pdf
- AEC - Q100-012 - Rev- - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems短路可靠性测试.pdf
- AEC - Q100-011 - Rev-C - Charged Device Model - CDM - Electrostatic Discharge Test带电设备型号- CDM -静电放电测试.pdf
- AEC - Q100-009 - Rev-B - Electrical Distribution Assessment 电分布评价测试.pdf
- 浙江省临海市白云高级中学2025届高三历史3月月考试题.doc
- 云南拾谷县第一中学2024_2025学年高二物理上学期10月月考试题.doc
- 2025版高考生物总复习第13讲基因的分离定律教案苏教版.doc
- 湖北省黄石实验高中2024_2025学年高一历史下学期期末考试模拟卷.doc
- 通史版2025版高考历史大一轮复习专题七近代化的曲折发展__中日甲午战争至五四运动前4第4讲从维新思想到新文化运动课后达标检测含解析新人教版.doc
- 2024年高考数学考试大纲解读专题04导数及其应用含解析文.doc
- 河南省许汝平九校联盟2024_2025学年高一语文上学期期末考试试题扫描版无答案.doc
- 江西省吉安市吉水县第二中学2024_2025学年高一历史上学期第二次月考试题.doc
- 北京市平谷区2025届高三政治一模考试试题含解析.doc
- 2025届中考物理第四讲物态变化专项复习测试无答案新人教版.docx
文档评论(0)