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AEC - Q103 - 003 Rev-
February 14, 2019
FAILURE MECHANISM BASED
STRESS TEST
QUALIFICATION
FOR
MEMS MICROPHONE DEVICES
Automotive Electronics Council
Component Technical Committee
AEC - Q103 - 003 Rev-
February 14, 2019
Automotive Electronics Council
Component Technical Committee
TABLE OF CONTENTS
AEC-Q103-003 Failure Mechanism Based Stress Test Qualification for MEMS
Microphones Devices
Appendix 1: Q103-003 Certification of Design, Construction and Qualification
Appendix 2: Minimum Requirements for MEMS Microphone Qualification Plans and
Results
AEC - Q103 - 003 Rev-
February 14, 2019
Automotive Electronics Council
Component Technical Committee
Acknowledgment
Any document involving a complex technology brings together experience and skills from many sources.
The Automotive Electronics Council would especially like to recognize the following significant contributors
to the development of this document:
MEMS Microphone Sub-Committee Members:
Ahmed Abdelrazek formerly with ams AG
Christoph Lercher ams AG
Mark Sears Bose (retired)
XinMiao Zhao Cirrus Logic (retired)
Steven Sibrel Harman International
Andy Mackie
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