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th
ISTFA ’93: The 19 International Symposium for Testing Failure Analysis, Los Angeles, California, USA/15-19 November 1993
An Investigation of Human Body Electrostatic Discharge
M.A. Kelly, G.E. Servais and T.V. Pfaffenbach
Delco Electronics
Kokomo, Indiana
Abstract Electrostatic discharge (ESD) events are
recognized as a significant contributor of early life
The electronics industry has recognized the failures and failures throughout the operating life of a
significance of Electrostatic Discharge (ESD) as a semiconductor device. Although present integrated
potential source of damage, especially to circuit designs include ESD protection circuitry, the
semiconductor devices, for some time. During that effectiveness of this protection must be determined
time, there has been an ongoing effort to develop a in a manner which will ensure its effectiveness in the
meaningful human body ESD pulse and equipment real world if the part is to meet the reliability
which is capable of repeatedly applying that pulse at requirements of the application.
various voltage levels to a semiconductor device. The ESD has been studied for some time, and there is
intent was to determine a parts ability to withstand an reasonable agreement on three (3) mode
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