Danfoss丹佛斯Semikron Danfoss Application Note Field Testing of Power Semiconductor Modules EN Rev-00 应用指南.pdf

ApplicationNoteRevision:00

AN20-003Issuedate:2020-08-04

Preparedby:PaulDrexhage

Approvedby:IngoRabl,Dr.UlrichNicolai

Keyword:testing,multimeter,DMM

Field-TestingofPowerSemiconductor

Modules

1.PurposeofTesting1

1.1ProductiontestingatSEMIKRON1

1.2IncominginspectionatOEM2

1.3Troubleshootingìgo/no-goîtestinginfield2

2.Equipment2

2.1Digitalmultimeterwithdiodecheckfunction2

2.1.1Forward(conducting)direction2

2.1.2Reverse(blocking)direction2

2.2Ohmmeter2

3.TestingDiode/ThyristorModules3

3.1Diode3

3.2Thyristor4

3.3Thyristorgatecharacteristics4

4.TestingIGBT/MOSFETModules5

4.1Forwardandreversecharacteristics6

4.2Gatecharacteristics7

5.TestingIPMsandGateDrivers7

5.1Powerbase7

5.2Gatedrivers8

5.2.1Biascurrent8

5.2.2Switchingcurrent9

5.2.3Errors10

6.Conclusion10

1.PurposeofTesting

Powersemiconductormodulesmaybesubjectedtomultipletestsduringtheirlifetimes.Asthecostand

complexityoftestingcanbehigh,itisimportanttoconsiderwhythedeviceisbeingtested.Improper

testingcanleadonetorejectagoodpartorworse,damageagooddevice.

1.1ProductiontestingatSEMIKRON

Everypowersemiconductorcomponentistestedtoensureitsproperfunctionality.Forward(conducting)

andreverse(blocking)