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JESD47L Stress-Test-Driven Qualification of Integrated Circuits原版完整文件.docx

JESD47L Stress-Test-Driven Qualification of Integrated Circuits原版完整文件.docx

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JEDEC

STANDARD

Stress-Test-DrivenQualificationof

IntegratedCircuits

JESD47L

(RevisionofJESD47KdatedAugust2018)

DECEMBER2022

JEDECSOLIDSTATETECHNOLOGYASSOCIATION

NOTICE

JEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,and

approvedthroughtheJEDECBoardofDirectorslevelandsubsequentlyreviewedandapproved

bytheJEDEClegalcounsel.

JEDECstandardsandpublicationsaredesignedtoservethepublicinterestthrougheliminating

misunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityand

improvementofproducts,andassistingthepurchaserinselectingandobtainingwithminimum

delaytheproperproductforusebythoseotherthanJEDECmembers,whetherthestandardisto

beusedeitherdomesticallyorinternationally.

JEDECstandardsandpublicationsareadoptedwithoutregardtowhetherornottheiradoption

mayinvolvepatentsorarticles,materials,orprocesses.BysuchactionJEDECdoesnotassume

anyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadopting

theJEDECstandardsorpublications.

TheinformationincludedinJEDECstandardsandpublicationsrepresentsasoundapproachto

productspecificationandapplication,principallyfromthesolidstatedevicemanufacturer

viewpoint.WithintheJEDECorganizationthereareprocedureswherebyaJEDECstandardor

publicationmaybefurtherprocessedandultimatelybecomeanANSIstandard.

Noclaimstobeinconformancewiththisstandardmaybemadeunlessallrequirementsstatedin

thestandardaremet.

Inquiries,comments,andsuggestionsrelativetothecontentofthisJEDECstandardor

publicationshouldbeaddressedtoJEDECattheaddressbelow,orrefertounder

StandardsandDocumentsforalternativecontactinformation.

Publishedby

?JEDECSolidStateTechnologyAssociation2022

3103NorthIOthStreet

Suite240South

Arlington,VA22201-2107

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